Scanning Probes Facility
Bruker AFM Dimension 3100
-
Contact mode, tapping mode, magnetic force microscopy
-
Measurements in fluid
-
Optical microscope
-
z range: 8 µm
-
x/y scanning range: 100 µm x 100 µm
-
x/y closed loop operation
-
Maximum sample height ca. 2 cm
Keysight Technologies Nanoindenter G 200
-
Continuous stiffness mode
-
XP and DCM-1 heads
-
Nanovision stage (AFM imaging with indenter)
-
High temperature cell (up to 250°C)
-
Optical microscope
-
Lateral force sensors
-
Maximum load 200 mN
-
Load resolution 50 nN
-
Depth resolution <0.01 nm
-
Positioning accuracy 1 µm (with nanovision stage 2 nm)
VISITEC Large Chamber SEM
-
Warm field emission gun
-
Two SE detectors, quadrant BSE detector, EBSD, EDX, Everhart-Thornley detector
-
Integrated servo-hydraulic testing machine with maximum testing force of 100 kN
-
Heating equipment for mechanical testing up to 350 °C
-
Chamber size 2 m³
-
Samples up to 700 mm in diameter, 600 mm in height and 300 kg
-
5 axes positioning system for electro-optical components and detectors
