Current Events:

2nd Erlangen School on Atom Probe Tomography
4. - 8. March 2019
Institute I, Materials Science and Engineering
GRK 1896 Springschool
18. - 20. March 2019
Pommelsbrunn
Symposium "Correlative and in situ microscopy in materials research"
1. - 4. April 2019
DPG Frühjahrstagung, Regensburg
5th CENEM Summer School for X-ray Scattering
29. July - 1. Aug. 2019
Institute for Crystallography and Structural Physics (ICSP)

User access to the Scanning Probes Facility

If you want to obtain access as a user to one of the instruments of the scanning probes division please contact one of the corresponding supervisors listed below.

Instrument Supervisors

Bruker AFM Dimension 3100

Dr.-Ing. Benoit Merle
Tel: 09131 85 27473
Email: benoit.merle@fau.de

M. Sc. Eva Preiß
09131/85-27485
Email: eva.preiss@fau.de

Keysight Technologies Nanoindenter G 200

Dr.-Ing. Benoit Merle
Tel: 09131 85 27473
Email: benoit.merle@fau.de

M. Sc. Jan Philipp Liebig
09131/85-27485
E-mail: jan.p.liebig@fau.de

VISITEC Large Chamber SEM

Dr.-Ing. Heinz Werner Höppel
Tel: 09131 85 27503
Email: hwe.hoeppel@fau.de

Dipl.-Ing. Christian Krechel
Tel: 0911/65078 65009
Email: christian.krechel@fau.de